控制图

该用哪张控制图

07 — 选图 · 图 10-5 · § 10.3.2

该用哪张控制图

按手册给出的决策路径。特别留意数据类型和合理子组大小:几乎整个选图结果都由这两点决定。

Are the data attribute data?

手工控制图参考卡

限的计算公式见第 10 章。

x̄ / s — mean and standard deviation§ 10.3.3.2 · pp. 81–82

Standard chart for continuous characteristics with bilateral tolerance, normal behavior, and no trends. Location chart limits are calculated from subgroup size: means narrow the process distribution compared to individual values (a ±2.58 σ limit for individual values narrows to ±1.15 σ with n = 5).

Location: UCL = μ̂ + u₁₋α⁄₂ · σ̂/√n LCL = μ̂ − u₁₋α⁄₂ · σ̂/√n Variation: UCL = √(χ²_{f;1−α/2} / f) · σ̂ LCL = √(χ²_{f;α/2} / f) · σ̂ with f = n − 1 Estimators: μ̂ = x̄̄ σ̂ = √(mean s²)
x̄ / R — mean and range§ 10.3.3.3 · pp. 83–84

Identical to x̄/s but monitoring range. R chart limits can be calculated exactly using standardized range w quantiles, or approximately using normal quantiles and the d₂ and d₃ constants.

Exact: UCL_R = w_{n;1−α/2} · σ̂ LCL_R = w_{n;α/2} · σ̂ Approximate: UCL_R = (1 + u₁₋α⁄₂ · d₃/d₂) · R̄ LCL_R = (1 − u₁₋α⁄₂ · d₃/d₂) · R̄ (if ≤ 0 → LCL_R = 0) Estimator: σ̂ = R̄/d₂
x̃ / R — median and range§ 10.3.3.4 · pp. 85–86

Alternative to means chart when reducing the influence of extreme values within samples is desirable: automated measurements with high variability, tensile tests. Reacts more slowly than the x̄ chart. ISO 7870-2 prefers the mean of sample medians.

UCL = μ̂ + u₁₋α⁄₂ · (cₙ/√n) · σ̂ LCL = μ̂ − u₁₋α⁄₂ · (cₙ/√n) · σ̂ cₙ = σ_x̃ / σ_x̄ (constants table, section 07)
Acceptance chart — tolerance-related§ 10.3.4 · p. 89

The only tolerance-related chart included in the manual. For processes with systematic and accepted location shifts (tool wear, stamping, step drilling). Requirement: instantaneous within-subgroup variation sufficiently small relative to tolerance, typically σ̂ ≤ T/10. Not compatible with zero-defect strategy: admits a defined nonconforming fraction.

x̄ chart: UCL = U − k_A·σ̂ LCL = L + k_A·σ̂ k_A = u₁₋p + u_PA/√n x̃ chart: k_C = u₁₋p + cₙ·u_PA/√n x chart : k_E = u₁₋p + u(ⁿ√P_A) p = accepted out-of-tolerance proportion P_A = action probability
Pearson chart — skewed distributions§ 10.3.5.2 · pp. 91–92

Process-related chart for skewed distributions (time-dependent model A2). Calculated like Shewhart, but standard normal percentiles are replaced by quantiles of an appropriate asymmetric distribution. With individual value charts, or n < 9, always preferred to Shewhart. Application: processes near natural boundaries (runout, flatness, straightness).

CL = x̿ UCL = X99.865% LCL = X0.135% of the fitted distribution Clements approximation (ISO 7870-5, ISO 22514-4): UCL = x̿ + ŝ · P99.865%(γ̂₁, β̂₂) LCL = x̿ − ŝ · P0.135%(γ̂₁, β̂₂)
Shewhart with extended limits§ 10.3.5.3 · pp. 93–94

When the process has inherent and expected mean changes, controlling with classic Shewhart limits proves uneconomical. Limits are widened by incorporating mean fluctuation as an additional term. Applicable to time-dependent models C1, C2, C3, B, and D. Application: processes with trends (wear, environmental influences) or varying process levels (different equipment).

With μ̂max and μ̂min: UCL = μ̂max + u_in · σ̂_in/√n LCL = μ̂min − u_in · σ̂_in/√n With σ_out via ANOVA: UCL = μ̂ + u_in·σ̂_in/√n + u_out·σ̂_out LCL = μ̂ − u_in·σ̂_in/√n − u_out·σ̂_out u_out = 1.5 is a standard empirical value
CUSUM — cumulative sum§ 10.3.5.4 · pp. 95–96

Represents cumulative sum of deviations between sample values and target value. Highly sensitive to small mean shifts: upward slope indicates rising mean, downward falling mean. Key requirement: process variation must be stable. Typical application: chemical processes where slight concentration fluctuations have major consequences. Graphical alternative: V-mask (ISO 7870-4).

CL = 0 UCL = +h·σ/√m LCL = −h·σ/√m CU_i = min{0 , CU_{i−1} + x̄_i − (T − k·σ/√m)} Illustrative ARL for mean shift (in units of σₑ): 0.0 → 370.4 1.0 → 9.9 2.0 → 3.9 See complete values in § 10.3.5.4 of the manual.
EWMA — exponentially weighted moving average§ 10.3.5.5 · p. 96

Weights samples in exponentially decreasing order: most recent samples carry greatest weight. Weighting is set by parameter λ. Detects small mean shifts well, but reacts slower to large shifts: recommended alongside a Shewhart chart to cover both. Application: products deliberately manufactured near specification limit, where detecting very small shifts is critical. Formula details in ISO 7870-6.

可交互 生成一条序列,比较检出速度

实验:哪张图先报警

同一条带刀具磨损的序列(自第 9 个样本起线性漂移),由三张图同时监控。放到车间实务里:Shewhart 对大阶跃直观好用;CUSUM 和 EWMA 累积小偏移的记忆,能早得多地发现渐进式漂移。在本模块的参数下(CUSUM k = 0.5、h = 5;EWMA λ = 0.2、L = 3),记忆型图维持着很高的 ARL₀(约 460–550,而 Shewhart 约 370)。

40 个样本的序列(漂移自第 9 个样本起)。条件:Shewhart 只用基本的 ±3σ 规则;μ 与 σ 已知;CUSUM 取 k = 0.5、h = 5;EWMA 取 λ = 0.2、L = 3。

Shewhart x̄

样本 21(偏移发生后第 13 个)
20.184720.153420.122120.090820.0595Drift onset (sample 9)UCL 20.1268CL 20.1000LCL 20.073215913172125293337x̄ · n = 5

CUSUM

样本 17(偏移发生后第 9 个)
106.8775.4744.0712.66-18.74Drift onset (sample 9)UCL 5.00CL 0.00LCL -5.0015913172125293337CUSUM · C⁺ (upper) / −C⁻ (lower) · k = 0.5 σ · h = 5 σ

EWMA

样本 16(偏移发生后第 8 个)
20.160220.140820.121420.102020.0826Drift onset (sample 9)UCL 20.1089CL 20.1000LCL 20.091115913172125293337EWMA · λ = 0.2

每个样本的 EWMA 精确动态控制限(±3σ·√(λ/(2−λ)·(1−(1−λ)²ⁱ)))。

Comparison of 1,000 simulated processes (drift of 0.2 σ/sample starting at sample 9, 40-sample horizon)
Chart % detected (s. 9–40) Median delay (from shift) % prior false alarm (s. 1–8) % without alarm (in 40 s.)
Shewhart x̄ 98.0 % 11 11 samples 2.0 % 0.0 %
CUSUM 99.6 % 9 9 samples 0.4 % 0.0 %
EWMA 98.4 % 9 9 samples 1.6 % 0.0 %
SQA Conclusion: With a drift of 0.2 σ/sample, CUSUM (9 9 samples) and EWMA (9 9 samples) detect the shift before Shewhart (11 11 samples). Memory charts accumulate consecutive deviations, while Shewhart depends on an individual mean crossing ±3σ limits (post-drift detection: 99.6% CUSUM, 98.4% EWMA vs 98.0% Shewhart).
Results breakdown: The three percentages (% detected post-drift, % prior false alarm, and % without alarm) classify all processes into disjoint categories (summing to 100%). Median delay is strictly computed over series with detection after shift onset (samples 9–40).

标准化极差分布的常数

标准化极差的 d₂(期望值)与 d₃(标准差),以及用于精确计算 R 图控制限的 w 分位数。§ 10.3.3.3 · 第 83–84 页。

nd₂d₃c₄w 99% lowerw 99% upperw 99.73% lowerw 99.73% uppercn median
21.1280.85250.7979 0.0093.970 0.0024.533 1.000
31.6930.88840.8862 0.1354.424 0.0704.950 1.160
42.0590.87980.9213 0.3434.694 0.2215.200 1.092
52.3260.86410.9400 0.5554.886 0.3975.378 1.198
62.5340.84800.9515 0.7495.033 0.5695.515 1.136
72.7040.83320.9594 0.9225.154 0.7295.627 1.214
82.8470.81980.9650 1.0755.255 0.8745.722 1.159
92.9700.80780.9693 1.2125.341 1.0065.803 1.223
103.0780.79710.9727 1.3355.418 1.1265.875 1.175
d₂, d₃ and w quantiles of the standardized range (§ 10.3.3.3). c₄ calculated by the gamma function. cn = σ for median charts (§ 10.3.3.4).

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